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CJC8910
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CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Product Demo
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Third party testing report
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Update Notice
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
Product Demo
Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
Update Notice
Home
>
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Third party testing report
> ESD testing (HBM)
CM8566_ Temperature cycle test report
release time:2023-03-16
publisher:
CM8660_ Temperature cycle test report
CL8022_ Temperature cycle test report
shares:
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