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CJC8910
CJC6811A
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CJC8990
Application description
Audio chip
Capacitive touch chip
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Power management IC
ASIC standard/custom development
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ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
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Third party testing report
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
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ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
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CJC8910
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CJC8990
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Audio chip
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MCU
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ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
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Home
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Third party testing report
> ESD testing (HBM)
CJC8974A_ Temperature cycle test report
release time:2023-03-02
publisher:CSC
CJC6811A_HTSL_12H
CJC8988_ Temperature cycle test report
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