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ESD testing (HBM)
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CJC8910
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CJC8990
Application description
Audio chip
Capacitive touch chip
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ASIC standard/custom development
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Third party testing report
ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
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Third party testing report
Main Control Zone
CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
Capacitive touch chip
MCU
Power management IC
ASIC standard/custom development
Product Demo
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ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
High and Low Temperature Testing (L/HTSL)
Update Notice
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CJC8910
CJC6811A
CJC8988
CJC8990
Application description
Audio chip
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MCU
Power management IC
ASIC standard/custom development
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ESD testing (HBM)
Temperature and Humidity Cycle (TCT)
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Home
>
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Third party testing report
> ESD testing (HBM)
CJC5357B_ Temperature cycle test report
release time:2023-03-16
publisher:CSC
CJC8909 Temperature Cycle Test
CJC5340_ Temperature cycle test report
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